XRD (X-ray diffraction) analysis is a technique used to study the structure of materials at the atomic or molecular level. It involves exposing a sample to high-energy X-rays and measuring the diffraction pattern produced, which can provide information about the arrangement of atoms in the material.
XRD analysis is commonly used for ZnO (zinc oxide) because it is a crystalline material with a well-defined crystal structure. This makes it ideal for XRD analysis, as the diffraction pattern produced can be easily matched to known reference patterns to identify the crystal structure and phase of the ZnO sample.
Peak matching is the process of comparing the diffraction pattern produced by a sample of ZnO to known reference patterns of different crystal structures and phases of ZnO. By matching the peaks in the sample's diffraction pattern to those in the reference patterns, the crystal structure and phase of the ZnO sample can be determined.
To perform peak matching in XRD analysis of ZnO, the diffraction pattern of the sample is first collected using a specialized instrument called an X-ray diffractometer. The pattern is then compared to a database of known reference patterns, and the peaks are matched to determine the crystal structure and phase of the ZnO sample.
XRD analysis of ZnO offers several benefits, including its non-destructive nature, high sensitivity, and ability to provide information about the crystal structure and phase of the material. It is also a relatively quick and straightforward technique, making it a valuable tool for studying the properties and characteristics of ZnO in various applications.