X-ray diffraction is a technique used to study the structure of materials by analyzing the scattering of X-rays off of the atoms within the material.
X-ray diffraction works by directing a beam of X-rays at a sample and measuring the angles and intensities of the scattered X-rays. This data is then used to determine the arrangement of atoms within the material.
The smallest angle of scattering in X-ray diffraction is the angle at which the X-rays are scattered at the smallest angle possible. This angle is dependent on the wavelength of the X-rays and the spacing between the atoms in the material.
The smallest angle of scattering is important in X-ray diffraction because it provides information about the spacing between atoms in a material, which in turn can reveal important structural information about the material.
X-ray diffraction has a wide range of applications, including the study of crystal structures in materials, the identification of unknown substances, and the analysis of protein structures in biological systems.