Why Does n=2 Not Produce an Equally Strong Peak in X-ray Diffraction?

In summary, the conversation discusses the application of Bragg's law in determining peaks in X-ray scattering, the comparison of X-ray scattering to Fraunhoffer diffraction, and the significance of the origin in calculating the Fourier transform of a crystal lattice. The structure factor and atomic scattering factors also play a role in determining the strength of peaks. The origin of the lattice vectors is not crucial in this process.
  • #1
thcommj
1
0
1. In satisfying the Bragg's law, [tex]n\lambda=2d\sin\theta[/tex], n is typically assumed to be one, which explains why we see only one peak for a particular plane (say [400] plane for silicon). But I really don't see why n=2 should not appear as an equally strong peak..?

2. Is the Fourier transform effect of X-ray scattering comparable to that of a Fraunhoffer diffraction by multiple slits?

3. In calculating the Fourier transform of the original lattice, how is the origin of the r vectors determined? Or it doesn't matter?

Thanks!
 
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  • #2
(1) Purely according to Bragg's law it should be an equally strong peak. However there is also a matter of the structure factor and atomic scattering factors. See B.D. Cullity chapter 4.

(2) I don't know

(3) It doesn't matter. The lattice vectors describe the translational periodicity of the crystal. Sometimes it is conceptually convenient to define one of the atoms as the origin, but this isn't necessary.
 
  • #3


1. The value of n in Bragg's law represents the order of the diffraction peak and is typically assumed to be one because it corresponds to the most intense diffraction peak. This is because the diffraction intensity decreases with increasing order due to factors such as the atomic arrangement and the wavelength of the X-rays. However, it is possible for higher order peaks to appear, but they will typically be weaker and may not be as easily detected.

2. The Fourier transform effect of X-ray scattering is similar to Fraunhofer diffraction by multiple slits in that both involve the interference of waves. However, X-ray scattering involves the interaction of X-rays with the periodic arrangement of atoms in a crystal, while Fraunhofer diffraction involves the interaction of light with a series of parallel slits. Therefore, there are some differences in the mathematical equations used to describe these phenomena.

3. In calculating the Fourier transform of the original lattice, the origin of the r vectors is typically chosen to be the center of the unit cell. However, this choice may vary depending on the specific crystal structure and the purpose of the calculation. In general, the origin of the r vectors does not significantly affect the resulting Fourier transform, but it may be important to consider for some applications.
 

Related to Why Does n=2 Not Produce an Equally Strong Peak in X-ray Diffraction?

1. What is X-ray diffraction?

X-ray diffraction is a technique used to analyze the structure of materials by shining X-rays onto a sample and measuring the angles and intensities of the diffracted beams.

2. How does X-ray diffraction work?

X-rays are directed at a sample, and as the X-rays strike the atoms within the sample, they are scattered in different directions. The pattern of scattered X-rays is recorded and can be used to determine the arrangement of atoms within the sample, providing information about the sample's structure.

3. What types of materials can be analyzed using X-ray diffraction?

X-ray diffraction can be used to analyze a wide range of materials, including crystals, powders, thin films, and liquids. It is particularly useful for studying the atomic and molecular structures of crystalline materials.

4. What are some applications of X-ray diffraction?

X-ray diffraction is used in various fields, such as materials science, chemistry, and biology, to determine the structure of materials. It is commonly used in the development and quality control of pharmaceuticals, as well as in the study of geological and environmental samples.

5. What are the benefits of using X-ray diffraction over other analytical techniques?

X-ray diffraction is a non-destructive and highly precise technique that provides information about the atomic and molecular structures of materials. It can also determine the composition, phase, and crystalline properties of materials, making it a valuable tool in many scientific fields.

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