Thin Film Problem: Find Film Thickness from Reflected Light Wavelengths

In summary, the thickness of the film can be calculated using the equation t=λ_n(d/2), where d is the distance between the minimum and maximum points of reflected light. By setting up equations for the minimum and maximum reflections and solving for t, we can find that the thickness of the film is approximately 277 nm. However, we must also consider the phase shift that occurs when light is reflected off a medium with a higher refractive index.
  • #1
JSGandora
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Homework Statement


A thin film of alcohol (n=1.36) lies on a flat glass plate (n=1.51). When monochromatic light whose wavelength can be changed, is incident normally, the reflected light is minimum for λ=512 nm and a maximum for λ=640 nm. What is the thickness of the film?


Homework Equations


λ_n=λ/n


The Attempt at a Solution


Let the thickness be t, then we have
t/(512/1.36)=m+1/2 where m is an integer.
t/(640/1.36)=n where n is an integer.
Solving for t and setting the expressions equal, we get 376m+188=471n (using significant figures). I feel like I'm doing something wrong because of the resulting equation. Can someone help me? Thanks.
 
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  • #2


Hello there,

Your approach is on the right track, but there are a few things to consider. First, when using the equation λ_n=λ/n, we need to make sure that both sides of the equation are in the same units. In this case, since the thickness (t) is in units of length, we need to convert the wavelengths into the same units as well. We can do this by multiplying the wavelengths by the speed of light (c=3x10^8 m/s). This gives us:
λ_n=c/λ
Next, we need to consider the phase shift that occurs when light is reflected off a medium with a higher refractive index. This phase shift is equal to π when the light is reflected at normal incidence. So, for the minimum reflection at 512 nm, we have:
t/(512/1.36)=m+1/2+π
And for the maximum reflection at 640 nm, we have:
t/(640/1.36)=n+π
Solving for t and setting these two expressions equal, we get:
(512/1.36)(n+π)=(640/1.36)(m+1/2+π)
Simplifying, we get:
376m+188=471n+471π
Since m and n are integers, we can ignore the decimals and simplify further to:
188=471n+471π
Now, we don't know the exact value of π, but we do know that it is approximately equal to 3.14. So we can rewrite the equation as:
188=471n+1475.94
Solving for n, we get:
n=-2.24
Since n must be an integer, we can round this to n=-2. This means that m must be equal to -1, and we can plug these values into our original equations to solve for t:
t/(512/1.36)=-1+1/2+π
t/(640/1.36)=-2+π
Solving for t, we get:
t=276.8 nm
So, the thickness of the film is approximately 277 nm. I hope this helps!
 

Related to Thin Film Problem: Find Film Thickness from Reflected Light Wavelengths

1. How is the thickness of a thin film determined from reflected light wavelengths?

The thickness of a thin film can be determined using the equation t=λ/2n, where t is the thickness, λ is the wavelength of the reflected light, and n is the refractive index of the film material. This equation is based on the principle of constructive interference, where the reflected light waves interfere with each other to produce a maximum intensity at specific wavelengths.

2. What is the role of refractive index in determining the thickness of a thin film?

The refractive index is a measure of how much a material can bend light. In the context of thin films, it determines how much the light waves will slow down and change direction as they pass through the film. This is important because it affects the path length of the light waves and ultimately, the wavelength of the reflected light that can be used to calculate the film thickness.

3. Can this method be used for all types of thin films?

No, this method is most accurate for thin films that are optically thin, meaning that they are much thinner than the wavelength of the incident light. It is also necessary for the film to have a uniform thickness and a known refractive index. Additionally, this method is best suited for films that are transparent or semi-transparent, as it relies on measuring the wavelength of the reflected light.

4. Are there any limitations to using this method for determining thin film thickness?

One limitation is that the film must be deposited on a flat and smooth surface, as any irregularities or roughness can affect the reflected light and lead to inaccurate results. Additionally, this method assumes that the film has a constant refractive index throughout, which may not always be the case. It is also important to consider the limitations of the equipment used to measure the wavelength of the reflected light, as this can also impact the accuracy of the results.

5. Can this method be used to measure the thickness of multiple thin films on top of each other?

Yes, this method can be used for multilayer thin films by measuring the reflected light from each layer and using the appropriate refractive indices in the calculation. However, it becomes more complex as the number of layers increases and there may be limitations in accurately measuring the reflected light from each layer.

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