Finding (1) wavelength, and (2) thickness of film for constructive interference

In summary, in the first conversation, the unknown wavelength of light can be determined by the fact that the third-order dark fringe from the known wavelength falls in the same place as the second-order bright fringe from the unknown wavelength. In the second conversation, the minimum thickness of a soap bubble needed for constructive interference of reflected light is related to the wavelength of the incident light and the index of refraction for the soap film. Reflections from the top and bottom surfaces must be in phase for constructive interference to occur.
  • #1
lunaplex
1
0
1) In a double-slit experiment, two parallel slits are illuminated first by light of wavelength 460nm, and then by light of unknown wavelength. The third-order (m = 3) dark fringe resulting from the known wavelength of light falls in the same place on the screen as the second-order (m = 2) bright fringe from the unknown wavelength. What is the unknown wavelength?

2) What is the minimum thickness of a soap bubble needed in order for the reflected light from the outer and inner surfaces to constructively interfere? The light incident on the film has a wavelength of 655nm. Assume that the index of refraction for the soap film is 1.35.

Help would be really appreciated, I've spent over an hour on these two problems and can't figure them out at all.
 
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  • #2
hi lunaplex - welcome to pf, generally you have a go and get help with your work, rather than someone doing it for you... but here's some hints to get you started

for the first I would revise your double slit notes, probably a useful equation for the intensity based on slit spacing and wavelength floating around - try and understand what it means & how its derived

for the 2nd constructive interfernce in thin films occurs when the reflected light at the top surface is in phase with the light reflected form the bottom surface... have a think how this relates the thickness to the wavelength, remebering some reflections cause phase changes
 

Related to Finding (1) wavelength, and (2) thickness of film for constructive interference

1. How do you find the wavelength for constructive interference?

To find the wavelength for constructive interference, you need to know the distance between two consecutive bright spots on the interference pattern. This distance is called the path difference. You can then use the formula λ = d/n, where λ is the wavelength, d is the path difference, and n is the order of the interference. This will give you the wavelength of the light that is causing the interference.

2. What is the relationship between the thickness of a film and constructive interference?

The thickness of a film plays a crucial role in determining whether constructive interference will occur or not. For a film to exhibit constructive interference, the thickness of the film must be equal to an integer multiple of the wavelength of the incident light. This means that the path difference between the two light waves traveling through the film must be equal to an integer multiple of the wavelength.

3. Can you determine the thickness of a film using only constructive interference?

Yes, it is possible to determine the thickness of a film using only constructive interference. As mentioned before, the thickness of the film must be equal to an integer multiple of the wavelength of the incident light for constructive interference to occur. By measuring the path difference and the wavelength, you can calculate the thickness of the film using the formula d = nλ, where d is the thickness, n is the order of interference, and λ is the wavelength.

4. How do you know if the interference is constructive or destructive?

The interference is constructive when the path difference between the two light waves is equal to an integer multiple of the wavelength. This results in bright spots on the interference pattern. On the other hand, the interference is destructive when the path difference is equal to an odd multiple of half the wavelength. This results in dark spots on the interference pattern.

5. What factors can affect the accuracy of determining the wavelength and thickness of a film for constructive interference?

There are several factors that can affect the accuracy of determining the wavelength and thickness of a film for constructive interference. These include the quality and consistency of the light source, the precision of the measuring instruments, and any external factors that may alter the interference pattern (e.g. temperature changes). It is important to control these factors as much as possible to obtain accurate results.

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