rude man said:Hint #1: deBroglie
Hint #2: Rayleigh
No. Why would you multiply m and e? It doesn't make any sense.Airplane7 said:So by using deBroglie equation lambda=h/p.. i'd have to do
6.63x10^-34Js / ((9.11x10^-31)(1.60x10^-19)) ??
vela said:No. Why would you multiply m and e? It doesn't make any sense.
Redbelly98 said:Moderator's note: I have moved this thread to Introductory Physics. In the future, please post questions of this level in Introductory Physics.
The information given for V can be used to find p.
No. The v in p=mv represents the velocity of the particle. The V in 2450 V stands for volt; it's a unit of electric potential. They're not the same thing at all.Airplane7 said:Lol, I'm not sure.. I'm confused on solving the question..
So, to find p, it's p=mv right? so (9.11 x 10^-31kg)(2450 v) ?
That's the basic idea, but you need to find the electron's momentum first.When i find the solution of p, plug it into lambda=h/p, so (6.63x10^-34 Js) / p , will give me the maximum resolution?
The maximum resolution of an electron microscope is calculated using the formula: R = 0.61λ/(NA), where R is the resolution, λ is the wavelength of the electrons, and NA is the numerical aperture of the objective lens. The higher the numerical aperture, the better the resolution.
Electron microscopes use electrons with a wavelength of around 0.005 nanometers (nm). This is much smaller than the wavelength of visible light, which is around 400-700 nm, allowing for a much higher resolution.
The maximum resolution of an electron microscope is much higher than that of a light microscope. Light microscopes have a maximum resolution of around 200 nm, while electron microscopes can reach resolutions of less than 0.1 nm.
Yes, the maximum resolution of an electron microscope can be improved by using a higher voltage, a smaller beam diameter, or a better objective lens with a higher numerical aperture. However, there is a limit to how much the resolution can be improved due to physical limitations.
The maximum resolution of an electron microscope can be affected by several factors, including the voltage and current of the electron beam, the quality and alignment of the lenses, the stability of the instrument, and the sample preparation techniques. Additionally, factors such as contamination or damage to the sample can also impact the resolution.