EDX vs. XPS: Which is Right for Your Application?

In summary, EDX and XPS are both analytical techniques used for sample analysis, but they differ in the method of measurement. EDX measures X-rays emitted from a sample while XPS measures photoelectrons. EDX is used for elemental analysis and chemical characterization, while XPS is used for surface analysis. Each technique has its own advantages and disadvantages, such as the need for high-energy beams in EDX and ultra-high vacuum conditions in XPS. Overall, they are related but serve different purposes in sample analysis.
  • #1
ninthwonder
1
0
Can someone help explain the difference between EDX(Energy-dispersive X-ray spectroscopy) vs. (XPS) X-ray photoelectron spectroscopy? Which is used for what application? Advantages/Disadvantages of each?

From what I have been reading from documentation, they seem to be the same.

Thanks.
 
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  • #2
EDX/EDS measures X-rays emitted from a sample, while XPS measures photoelectrons emitted from a sample. They are somewhat related.

"Energy-dispersive X-ray spectroscopy (EDS or EDX) is an analytical technique used for the elemental analysis or chemical characterization of a sample." "To stimulate the emission of characteristic X-rays from a specimen, a high-energy beam of charged particles such as electrons or protons (see PIXE), or a beam of X-rays, is focused into the sample being studied." The process relies on the uniquness of characteristic X-rays of each element.

Ref: http://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy

http://micron.ucr.edu/public/manuals/EDS-intro.pdf

http://mee-inc.com/eds.html

http://serc.carleton.edu/research_education/geochemsheets/eds.html


X-ray photoelectron spectroscopy measures the characteristic photoelectrons emitted from a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. XPS requires ultra-high vacuum (UHV) conditions.

Ref: http://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy


http://www.phi.com/surface-analysis-techniques/xps.html

http://www.eaglabs.com/mc/x-ray-photoelectron-spectroscopy.html

http://mmrc.caltech.edu/SS_XPS/XPS_PPT/XPS_Slides.pdf
 
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Related to EDX vs. XPS: Which is Right for Your Application?

1. What is the main difference between EDX and XPS?

EDX (Energy Dispersive X-Ray Spectroscopy) and XPS (X-Ray Photoelectron Spectroscopy) are both surface analysis techniques that use X-rays to analyze the elemental and chemical composition of a material. The main difference between them is the type of X-rays used. EDX uses a broader range of X-rays, while XPS uses a narrower range of X-rays.

2. Which technique is better for determining the chemical composition of a material?

Both EDX and XPS can provide information on the chemical composition of a material. However, XPS is generally considered to be more accurate and sensitive, making it the preferred technique for determining chemical composition.

3. Can EDX and XPS be used on the same sample?

Yes, it is possible to use both EDX and XPS on the same sample. In fact, many researchers use both techniques to complement each other and obtain a more comprehensive analysis of their sample.

4. What are the advantages of using EDX?

EDX is a fast and non-destructive technique, making it a good choice for analyzing large areas or large numbers of samples. It is also relatively easy to use and requires minimal sample preparation.

5. When should I use XPS over EDX?

XPS is a more sensitive technique and can provide more detailed information on the chemical composition of a material. It is best suited for analyzing small areas or samples with complex compositions. Additionally, XPS can provide information about the chemical state of elements, which is not possible with EDX.

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